检索到 14 条 主题词=Automatic checkout equipment. 的结果
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西文期刊1.Electronics test. TN1/7X
馆藏复本：1
可借复本：1
Miller Freeman Publications, etc.]
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西文图书2.Automatic testing 81 & test instrumentaion : Metropole Convention Centre, Brighton, England, 7-10 De TP216/E2:4
馆藏复本：2
可借复本：2 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
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西文图书3.International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venu TP29-53/E3
馆藏复本：1
可借复本：1 organised by the Control and Automation and Electronics Divisions of the Institution of Electrical E
The Institution, 1977.
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西文图书4.Discover the new world of test and design : International Test Conference 1992 proceedings : Septemb TB22-53/E1:(92)
馆藏复本：1
可借复本：1 sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Sec
The Conference ; c1992.
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西文图书5.Testing in the 1980's / TP306-53/E1:(81)
馆藏复本：5
可借复本：5 1981 International Test Conference, Philadelphia at the Franklin Plaza Hotel, Oct. 27-29, 1981.
IEEE, 1981.
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西文图书6.Automatic testing 81 & test instrumentaion : Metropole Convention Centre, Brighton, England, 7-10 De TP216/E2:6
馆藏复本：2
可借复本：2 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
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西文图书7.Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Resear TP30-53/E4:(82)
馆藏复本：2
可借复本：2 Workshop on Industrial Applications of Machine Vision
IEEE Computer Society Press, 1982.
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西文图书8.High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Bosto TP391.4-53/E6:(90)
馆藏复本：1
可借复本：1 Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering
SPIE, c1991.
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西文图书9.Testing for the 80's / TP306-53/E1:(80)
馆藏复本：2
可借复本：2 1980 Test Conference, Franklin Plaza Hotel, Philadelphia, Nov. 11, 12, 13, 1980.
IEEE, 1980.
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西文图书10.Error detecting codes, self-checking circuits and applications / TP301/E29
馆藏复本：3
可借复本：2 John Wakerly.
North-Holland, c1978.
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西文图书11.Autotestcon '78 : International Automatic Testing Conference : conference record / TP29-53/E2
馆藏复本：1
可借复本：1 sponsored by the Institute of Electrical and Electronic Engineers ... [et al.].
IEEE, c1978.
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西文图书12.Automatic testing 81 & test instrumentaion : Metropole Convention Centre, Brighton, England, 7-10 De TP216/E2:7
馆藏复本：2
可借复本：2 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
(0) 馆藏 -
西文图书13.Autotestcon '85 / TM93-53/E1:(85)
馆藏复本：1
可借复本：1 proceedings, Long Island, N.Y., October 22-24, 1985, IEEE International Automatic Testing Conference
IEEE ; c1985.
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西文图书14.Industrial optical sensing / TN2-53/11:(88)E
馆藏复本：1
可借复本：1 James Carney, Ernie Stelzer, editors.
International Society for Optical Engineering, c1988.
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