西安工业大学图书馆书目检索系统

Online Public Access Catalogue

题名/责任者:

Discover the new world of test and design : International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.

出版发行项:

Altoona, PA : The Conference ; Piscataway, NJ : Can be ordered from IEEE Service Center, c1992.

ISBN:

0780307607 (casebound)

ISBN:

0818631678 (softbound)

ISBN:

081863166X (microfiche)

载体形态项:

xii, 1012 p. : ill. ; 28 cm.

会议名称:

International Test Conference (1992 : Baltimore, Md.)

附加团体名称:

Institute of Electrical and Electronics Engineers. Philadelphia Section.

附加团体名称:

IEEE Computer Society. Test Technology Technical Committee.

论题主题:

Automatic checkout equipment-Congresses.

论题主题:

Integrated circuits-Testing-Congresses.

中图法分类号:

TP22-53

一般附注:

"IEEE catalog number 92-CH3191-4"--P. ii.

一般附注:

"IEEE Computer Society Press order number 3167"--P. ii.

一般附注:

Cover title.

书目附注:

Includes bibliographical refrences and index.

豆瓣简介：