检索到 4 条 责任者=International Test Conference 的结果
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西文图书1.Proceedings : International Test Conference 1991, October 26-30, 1991, Opryland Hotel, Nashville, TN TN0-53/1:(91)E
馆藏复本：1
可借复本：1 sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Se
International Test Conference, c1991.
(0) 馆藏 -
西文图书2.Testing for the 80's / TP306-53/E1:(80)
馆藏复本：2
可借复本：2 1980 Test Conference, Franklin Plaza Hotel, Philadelphia, Nov. 11, 12, 13, 1980.
IEEE, 1980.
(0) 馆藏 -
西文图书3.Testing in the 1980's / TP306-53/E1:(81)
馆藏复本：5
可借复本：5 1981 International Test Conference, Philadelphia at the Franklin Plaza Hotel, Oct. 27-29, 1981.
IEEE, 1981.
(0) 馆藏 -
西文图书4.Discover the new world of test and design : International Test Conference 1992 proceedings : Septemb TB22-53/E1:(92)
馆藏复本：1
可借复本：1 sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Sec
The Conference ; c1992.
(0) 馆藏
