西安工业大学图书馆书目检索系统

Online Public Access Catalogue

题名/责任者:

Proceedings : International Test Conference 1991, October 26-30, 1991, Opryland Hotel, Nashville, TN / sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section.

出版发行项:

Altoona, Pa. : International Test Conference, c1991.

ISBN:

0780302427 (library binding)

ISBN:

0818661569 (microfiche)

ISBN:

0818691565 (hard)

载体形态项:

xiv, 1135 p. : ill. ; 28 cm.

附加非控制题名:

International Test Conference 1991 proceedings.

附加非控制题名:

Test: faster, better, sooner.

会议名称:

International Test Conference (22nd : 1991 : Nashville, Tenn.)

附加团体名称:

Institute of Electrical and Electronics Engineers. Philadelphia Section.

附加团体名称:

IEEE Computer Society. Test Technology Technical Committee.

论题主题:

Electronic digital computers-Circuits-Testing-Congresses.

论题主题:

Integrated circuits-Testing-Congresses.

中图法分类号:

TN0-53

一般附注:

"IEEE catalog number 91CH3032-0."

一般附注:

Cover title: Test: faster, better, sooner.

书目附注:

Includes bibliographies and index.

豆瓣简介：