检索到 1 条 分类号=TP22-53 的结果
-
西文图书1.Discover the new world of test and design : International Test Conference 1992 proceedings : Septemb TB22-53/E1:(92)
馆藏复本：1
可借复本：1 sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Sec
The Conference ; c1992.
(0) 馆藏
