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题名/责任者:

High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts / Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering.

出版发行项:

Bellingham, Wash., USA : SPIE, c1991.

ISBN:

0819404519

载体形态项:

ix, 355 p. : ill. ; 28 cm.

丛编说明:

Proceedings / SPIE--the International Society for Optical Engineering ; v. 1384

丛编统一题名:

Proceedings of SPIE--the International Society for Optical Engineering ; v. 1384.

附加个人名称:

Chen, Michael J. W.

附加团体名称:

Society of Photo-optical Instrumentation Engineers.

附加会议名称:

OE/Boston '90 (1990)

附加会议名称:

Symposium on Advances in Intelligent Systems (1990 : Boston, Mass.)

论题主题:

Computer vision-Congresses.

论题主题:

Automatic checkout equipment-Industrial applications-Congresses.

论题主题:

Optical character recognition devices-Industrial applications-Congresses.

论题主题:

Quality control-Optical methods-Automation-Congresses.

中图法分类号:

TP391.4-53

一般附注:

"Part of a four-conference program on Machine Vision System Integration held at SPIE's Symposium on Advances in Intelligent Systems, a part of OE/Boston '90, 4-9 November 1990, in Boston, Massachusetts"--P. viii.

书目附注:

Includes bibliographical references and index.

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