-
西文图书1.1978 Semiconductor Test Conference : digest of papers, Cherry Hill, N.J., Oct. 31, Nov 1-2, 1978 / TN304-53/E6
馆藏复本:1
可借复本:1 sponsored by IEEE Computer Society, Test Technology Committee and the Phila. Section of the IEEE.
IEEE, 1978.
(0) 馆藏
-
西文图书2.Shape-memory materials and phenomena--fundamental aspects and applications : symposium held December TP304-53/1:(91)E
馆藏复本:1
可借复本:1 editors, C.T. Liu ... [et al.].
Materials Research Society, c1992.
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