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西文图书1.Automatic testing 81 & test instrumentaion : Metropole Convention Centre, Brighton, England, 7-10 De TP216/E2:4
馆藏复本:2
可借复本:2 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
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西文图书2.Automatic testing 81 & test instrumentaion : Metropole Convention Centre, Brighton, England, 7-10 De TP216/E2:7
馆藏复本:2
可借复本:2 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
(0) 馆藏 -
西文图书3.Automatic testing 81 & test instrumentaion : Metropole Convention Centre, Brighton, England, 7-10 De TP216/E2:6
馆藏复本:2
可借复本:2 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
(0) 馆藏 -
西文图书4.Discover the new world of test and design : International Test Conference 1992 proceedings : Septemb TB22-53/E1:(92)
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可借复本:1 sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Sec
The Conference ; c1992.
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