检索到 2 条 责任者=The Institute of Electrical and Electronics Engineers. 主题=automatic checkout equipment 馆藏地=西文密集 文献类型=西文图书 的结果
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西文图书1.Autotestcon '85 / TM93-53/E1:(85)
馆藏复本：1
可借复本：1 proceedings, Long Island, N.Y., October 22-24, 1985, IEEE International Automatic Testing Conference
IEEE ; c1985.
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西文图书2.Discover the new world of test and design : International Test Conference 1992 proceedings : Septemb TB22-53/E1:(92)
馆藏复本：1
可借复本：1 sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Sec
The Conference ; c1992.
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