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题名/责任者:

2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France / editors, Michel Grosmann, Patrick Meyrueis ; organized by European Photonics Association in collaboration with the Society of Photo-optical Instrumentation Engineers.

出版发行项:

Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, c1980.

ISBN:

0892522380

载体形态项:

x, 228 p. : ill. ; 28 cm.

变异题名:

Second European Congress on Optics Applied to Metrology (METROP)

丛编题名:

Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 210

会议名称:

European Congress on Optics Applied to Metrology (2nd : 1979 : Strasbourg, France)

附加个人名称:

Meyrueis, Patrick.

附加个人名称:

Grosmann, Michel.

附加团体名称:

Society of Photo-optical Instrumentation Engineers.

附加团体名称:

European Photonics Association.

附加会议名称:

Optics, Photonics, and Iconics Engineering Meeting (1979 : Strasbourg, France)

论题主题:

Holographic interferometry-Congresses.

论题主题:

Speckle metrology-Congresses.

论题主题:

Optical measurements-Congresses.

中图法分类号:

TB9-53

书目附注:

Includes bibliographical references and indexes.

豆瓣简介：