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Online Public Access Catalogue

题名/责任者:

Autotestcon '78 : International Automatic Testing Conference : conference record / sponsored by the Institute of Electrical and Electronic Engineers ... [et al.].

出版发行项:

New York : IEEE, c1978.

载体形态项:

viii, 405 p. : ill. ; 28 cm.

会议名称:

AUTOTESTCON (1978 : San Diego, Calif.)

附加团体名称:

Institute of Electrical and Electronics Engineers.

论题主题:

Automatic checkout equipment-Congresses.

中图法分类号:

TP29-53

一般附注:

"78CH1416-7 AES."

书目附注:

Includes bibliographical references.

豆瓣简介：