-
西文图书1.Autotestcon '85 / TM93-53/E1:(85)
馆藏复本:1
可借复本:1 proceedings, Long Island, N.Y., October 22-24, 1985, IEEE International Automatic Testing Conference
IEEE ; c1985.
(0) 馆藏 -
西文图书2.Autotestcon '78 : International Automatic Testing Conference : conference record / TP29-53/E2
馆藏复本:1
可借复本:1 sponsored by the Institute of Electrical and Electronic Engineers ... [et al.].
IEEE, c1978.
(0) 馆藏