MARC状态:已编 文献类型:西文图书 浏览次数:15
- 题名/责任者:
- 1979 Semiconductor Test Conference : digest of papers, Cherry Hill, N.J., Oct. 23-25, 1979 / sponsored by IEEE Computer Society, Test Technology Committee and the Phila. Section of the IEEE.
- 出版发行项:
- Long Beach : IEEE, 1979.
- 载体形态项:
- 382 p. : ill.
- 会议名称:
- Semiconductor Test Conference (1979 : Cherry Hill, N.J.)
- 附加团体名称:
- Institute of Electrical and Electronics Engineers. Philadelphia Section.
- 附加团体名称:
- IEEE Computer Society. Test Technology Committee.
- 中图法分类号:
- TP306
- 书目附注:
- Includes bibliographical references.
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