机读格式显示(MARC)

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• 000 1000007187

• 001 0000163516

• 003 CAL

• 005 20050125092912.0

• 008 970619s1979 caua b 100 0 eng

• 020 __ |c CNY44.00

• 040 __ |c SJT

• 041 0_ |a eng

• 090 __ |a TN306/E7

• 093 __ |a TP306 |2 3

• 099 __ |a CALB022000340959

• 111 2_ |a Semiconductor Test Conference |d (1979 : |c Cherry Hill, N.J.)

• 245 15 |a 1979 Semiconductor Test Conference : |b digest of papers, Cherry Hill, N.J., Oct. 23-25, 1979 / |c sponsored by IEEE Computer Society, Test Technology Committee and the Phila. Section of the IEEE.

• 260 __ |a Long Beach : |b IEEE, |c 1979.

• 300 __ |a 382 p. : |b ill.

• 504 __ |a Includes bibliographical references.

• 710 2_ |a Institute of Electrical and Electronics Engineers. |b Philadelphia Section.

• 710 2_ |a IEEE Computer Society. |b Test Technology Committee.

• 905 __ |a XATU |d TN306/E7

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TN306/E7

• 991 __022005003157

• 998 __ |a SJT

• 999 __ |t C |A zhouwei |a 20050125 09:27:49 |I zhouwei |i 20050125 09:29:12 |G zhouwei |g 20050125 09:29:3