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题名/责任者:

Surface characterization and testing II : 10-11 August 1989, San Diego, California / John E. Greivenkamp, Matt Young, chairs/editors.

出版发行项:

Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1989.

ISBN:

0819402001

载体形态项:

vi, 271 p. : ill. ; 28 cm.

丛编说明:

Proceedings / SPIE--the International Society for Optical Engineering ; v. 1164

丛编统一题名:

Proceedings of SPIE-the International Society for Optical Engineering ; v. 1164.

附加个人名称:

Young, Matt, 1941-

附加个人名称:

Greivenkamp, John E.

附加团体名称:

Society of Photo-optical Instrumentation Engineers.

论题主题:

Surfaces (Technology)-Optical properties-Congresses.

论题主题:

Surfaces (Technology)-Testing-Congresses.

中图法分类号:

O43-53

一般附注:

"Sponsored by SPIE--the International Society for Optical Engineering."

书目附注:

Includes bibliographical references and index.

豆瓣简介：