MARC状态：已编 文献类型：西文图书 浏览次数：35
- 题名/责任者:
- Developments in integrated circuit testing D. M. Miller, editor.
- 出版发行项:
- London Academic Press Limited c1987.
- ISBN:
- 0124967353
- 载体形态项:
- x, 440 p. ill. 24 cm.
- 附加个人名称:
- Miller, D. M.
- 论题主题:
- Digital integrated circuits-Testing.
- 中图法分类号:
- TN407
- 书目附注:
- Includes bibliographical references and index.
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西文