机读格式显示(MARC)

• 000 01409nam2 2200385 4500

• 000 1000001052

• 001 0000157565

• 003 CAL

• 005 20040622082757.0

• 008 040225r20041990cc a b 001 0 eng d

• 017 __ |a 图字：01-2003-8066 |b CN

• 020 __ |a 7302077479 |c CNY65.00

• 040 __ |a XAIT |c XAIT

• 041 0_ |a eng |b chi

• 082 00 |a 621.381/5 |2 20

• 090 __ |a TN431.2/10E

• 093 __ |a TN431.2 |2 4

• 099 __ |a CAL 022004015429

• 100 1_ |a Abramovici, Miron.

• 245 10 |a Digital systems testing and testable design = |b 数字系统测试和可测性设计 / |c Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

• 246 31 |a 数字系统测试和可测性设计

• 260 __ |a 北京 : |b 清华大学出版社, |c c2004.

• 300 __ |a xvii, 652 p. : |b ill. ; |c 26 cm.

• 440 _0 |a 国外大学优秀教材. |p 微电子类系列

• 504 __ |a Includes bibliographical references and index.

• 534 __ |p Reprint. Originally published: |c New York, NY : John Wiley Sons Inc., c1990. |b Revised printing.

• 650 _0 |a Digital integrated circuits |x Design and construction.

• 650 _0 |a Digital integrated circuits |x Testing.

• 700 1_ |a Friedman, Arthur D.

• 700 1_ |a Breuer, Melvin A.

• 905 __ |a XATU |d TN431.2/10E

• 920 __ |a 261060 |z 4

• 950 __ |a 261060 |f TN431.2/10

• 991 __022004001053

• 999 __ |t C |A shenxiaoyan |a 20040607 14:37:51 |M shenxiaoyan |m 20040607 14:44:27 |I zhouwei |i 20040622 08:27:57 |G zhouwei |g 20040622 08:28:0