机读格式显示(MARC)

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• 000 1000007724

• 001 0000164028

• 003 CAL

• 005 20050125164313.0

• 008 961120s1987 nyua b 001 0 eng d

• 010 __ |a 86-27510

• 020 __ |a 007044093X |c CNY15.60

• 035 __ |a 3940518

• 040 __ |a XAIT |c XAIT

• 050 00 |a QA76.76.T48 |b M87 1987

• 090 __ |a TP31/E87

• 093 __ |a TP31 |2 4

• 099 __ |a CAL 021999653546 |a CAL 022000353327 |a CAL 021999655541

• 100 1_ |a Musa, John D.

• 245 10 |a Software reliability : |b measurement, prediction, application / |c John D. Musa, Anthony Iannino, Kazuhira Okumoto.

• 260 __ |a New York : |b McGraw-Hill, |c c1987.

• 300 __ |a xvii, 621 p. : |b ill. ; |c 25 cm.

• 490 1_ |a McGraw-Hill series in software engineering and technology.

• 504 __ |a Includes bibliographical references (p. 593-599) and indexes.

• 650 _0 |a Computer software |x Reliability.

• 650 _0 |a Computer software |x Testing.

• 700 1_ |a Okumoto, Kazuhira.

• 700 1_ |a Iannino, Anthony.

• 830 _0 |a McGraw-Hill series in software engineering and technology.

• 905 __ |a XATU |d TP31/E87

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TP31/E87

• 991 __022005003679

• 999 __ |t C |A shenxiaoyan |a 20050125 16:41:50 |M shenxiaoyan |m 20050125 16:43:13 |G shenxiaoyan |g 20050125 16:43:4