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• 000 01363nam2 2200421 4500

• 000 1000007630

• 001 0000163937

• 003 CAL

• 005 20050125154330.0

• 008 981216s1978 nyua b 10000 eng

• 020 __ |a |c CNY5.90

• 040 __ |a XAIT |c SJT

• 050 0_ |a TK7878.4 |b .A973 1978

• 082 __ |a 681/.2

• 090 __ |a TP29-53/E2

• 093 __ |a TP29-53 |2 4

• 099 __ |a CAL 022000331602

• 111 2_ |a AUTOTESTCON |d (1978 : |c San Diego, Calif.)

• 245 10 |a Autotestcon '78 : |b International Automatic Testing Conference : conference record / |c sponsored by the Institute of Electrical and Electronic Engineers ... [et al.].

• 260 __ |a New York : |b IEEE, |c c1978.

• 300 __ |a viii, 405 p. : |b ill. ; |c 28 cm.

• 500 __ |a "78CH1416-7 AES."

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Automatic checkout equipment |x Congresses.

• 710 20 |a Institute of Electrical and Electronics Engineers.

• 905 __ |a XATU |d TP29-53/E2

• 920 __ |a 212020 |z 1

• 920 __ |a 211130 |z 1

• 920 __ |a 211030 |z 1

• 920 __ |a 251050 |z 1

• 920 __ |a 244050 |z 1

• 920 __ |a 242120 |z 1

• 920 __ |a 231030 |b TP274-53 |c I51A 1978 |z 1

• 920 __ |a 231220 |z 1

• 950 __ |a 261060 |f TP29-53/E2

• 991 __022005003585

• 998 __ |a SJT

• 999 __ |t C |A shenxiaoyan |a 20050125 15:42:48 |M shenxiaoyan |m 20050125 15:43:30 |G shenxiaoyan |g 20050125 15:43:4