机读格式显示(MARC)

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• 017 __ |a CN |b 08-2013-079

• 020 __ |a 9787560342801 (pbk.) |c CNY88.00

• 040 __ |a NPU |c NPU

• 090 __ |a TN304.1/E1

• 093 __ |a TN304.1 |2 4

• 099 __ |a CAL 022014024816

• 245 00 |a Characterization in silicon processing = |b 硅加工中的表征 / |c [editor], Yale E. Strausser. |s 英文影印版

• 246 31 |a 硅加工中的表征

• 260 __ |a 哈尔滨 : |b Harbin Institute of Technology Press, |c 2014.

• 300 __ |a xv, 240 p. : |b ill. ; |c 23 cm.

• 490 0_ |a Materials characterization series

• 490 0_ |a 材料表征原版系列丛书

• 504 __ |a Includes bibliographical references and index.

• 534 __ |p Reprint. Originally published: |c New York : Momentum Press, 2010. |z 9781606501092.

• 650 _0 |a Electric conductors.

• 650 _0 |a Semiconductor films.

• 650 _0 |a Silicon.

• 650 _0 |a Surface chemistry.

• 700 1_ |a Strausser, Yale.

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