机读格式显示(MARC)
- 000 01117nam2 2200289 4500
- 008 040621s1990 dcu b 100 0 eng d
- 111 2_ |a Standards and technology |n ( |d 1990 |c Washington, DC)
- 245 10 |a Semiconductor measurement technology |b a software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models |c J. F. Marchiando.
- 246 31 |a A software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models.
- 260 __ |a Washington, D.C. |b U.S. Department of Commerce. |c 1990.
- 300 __ |a vi, 334, A-21 p. |c 28 cm.
- 440 _0 |a NIST special publication 400-84.
- 504 __ |a Includes bibliographical references.
- 650 _0 |a Software program.
- 700 1_ |a Marchiando, J.F.
- 905 __ |a XATU |d TN3-65/1:(90)E
- 950 __ |a 261060 |f TN3-65/1:(90)
- 999 __ |t A |A shenxiaoyan |a 20040621 17:05:58 |G shenxiaoyan |g 20040621 17:06:4