机读格式显示(MARC)

• 000 01370nam2 2200373 4500

• 000 1000007367

• 001 0000163689

• 005 20050125105628.0

• 008 020308s1992 gw b 001 0 eng

• 010 __ |a 91023385

• 020 __ |a 0139118012 |c CNY11.80

• 040 __ |a XAIT |c XAIT

• 041 0_ |a eng

• 050 00 |a TK7868.D5 |b W4313 1992

• 082 00 |a 621.381/5 |2 20

• 090 __ |a TN710/E3

• 093 __ |a TN707 |2 3

• 099 __ |a CAL 022000231026 |a 2000231026 |a CAL 022000324327 |a CAL 022000396748 |a CAL 022000432431 |a CAL 022000348722

• 100 1_ |a Weyerer, Manfred.

• 240 10 |a Pr鑥fbarkeit elektronischer Schaltungen. |l English.

• 245 10 |a Testability of electronic circuits / |c Manfred Weyerer and Gerald Goldemund ; translated by Klaus Selke.

• 260 __ |a Munich : |b C. Hanser ; |a Englewood Cliffs, NJ : |b Prentice Hall, |c c1992.

• 300 __ |a 232 p. |c 20 cm.

• 500 __ |a Translation of: Pr鑥fbarkeit elektronischer Schaltungen.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Digital electronics |x Testing.

• 650 _0 |a Electronic circuit design.

• 650 _0 |a Electronic circuits |x Testing.

• 700 1_ |a Goldemund, Gerald.

• 905 __ |a XATU |d TN710/E3

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TN710/E3

• 991 __022005003330

• 999 __ |t C |A shenxiaoyan |a 20050125 10:54:20 |M shenxiaoyan |m 20050125 10:56:28 |G shenxiaoyan |g 20050125 10:56:4