机读格式显示(MARC)

• 000 00916nam2 2200241 4500

• 000 1000007409

• 001 0000163729

• 005 20050125111857.0

• 008 000127s1990 waua 100 0 eng d

• 020 __ |a |c CNY16.40

• 040 __ |a TSU |c XAIT

• 090 __ |a TN304-53/E1:(89)

• 093 __ |a TN304-53 |2 4

• 245 00 |a Analytical and techniques for semiconductor materials & process characterization: |b proceedings of the satellite symposium to essderc 89 Berlin. / |c editors, Bernd O. Kolbesen ... [et al.] .

• 260 __ |a New York: |b The Electrochemical Society, Inc, |c 1990.

• 300 __ |a viii, 364 p. |b ill. |c 21 cm

• 700 1_ |a Kolbesen, Bernd O.

• 710 2_ |a The Electrochemical Society, Inc.

• 905 __ |a XATU |d TN304-53/E1:(89)

• 920 __ |a 261060 |z 2

• 950 __ |a 261060 |f TN304-53/E1:(89)

• 991 __022005003367

• 999 __ |t C |A shenxiaoyan |a 20050125 11:12:38 |M shenxiaoyan |m 20050125 11:18:57 |G shenxiaoyan |g 20050125 11:19:1