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• 000 01102nam2 2200289 4500

• 000 1000007654

• 001 0000163960

• 005 20050125161354.0

• 008 050125s1983 caua b 000 0 eng d

• 020 __ |a 0892523859 |c CNY117.60

• 040 __ |a XAIT |c XAIT

• 090 __ |a TN21-53/E6:3(82)

• 093 __ |a TN21-53 |2 4

• 111 2_ |a Proceedings of SPIE-the international s ociety for optical engineering |n ( |d August 24-25,1982 |c San Diego, California.)

• 245 00 |a Focal plane methodologies III |b proceedings of SPIE-the international society for optical engineering |c chairmen/editors, William S. Chan, John T. Hall.

• 260 __ |a California |b SPIE |c 1982.

• 300 __ |a vi, 130 p. |b ill. |c 29 cm

• 440 _2 |a Proceedings of SPIE |v v. 350

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Issues |x Requirements.

• 700 1_ |a Hall, John T.

• 700 1_ |a Chan, William S.

• 905 __ |a XATU |d TN21-53/E6:3(82)

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TN21-53/E6:3(82)

• 991 __022005003609

• 999 __ |t C |A shenxiaoyan |a 20050125 16:10:09 |M shenxiaoyan |m 20050125 16:13:54 |G zhouwei |g 20050411 16:34:2