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• 000 01070nam2 2200349 4500

• 000 1000006786

• 001 0000163131

• 003 CAL

• 005 20050124103816.0

• 008 851114s1986 us 001 0 eng d

• 010 __ |a 85028261

• 020 __ |a 0306421402 |c CNY7.00

• 035 __ |a 3740445

• 040 __ |a NLM |c NLM |d OSU

• 060 0_ |a QH 212.S3 |b A244 (P)

• 090 __ |a TN27/E5

• 093 __ |a TN27 |2 3

• 099 __ |a CAL 021999653439 |a CAL 022000306872

• 245 00 |a Advanced scanning electron microscopy and X-ray microanalysis / |c Dale Newbury ... [et al.]

• 260 __ |a New York : |b Plenum Press, |c c1986.

• 300 __ |a xii, 454 p., [4] p. of plates : |b ill. ; |c 24 cm.

• 500 __ |a Includes index.

• 504 __ |a Bibliography: p. 435-448.

• 650 _0 |a X-ray microanalysis.

• 650 _0 |a Scanning electron microscopes.

• 700 1_ |a Newbury, Dale E.

• 905 __ |a XATU |d TN27/E5

• 920 __ |a 211010fg |z 1

• 950 __ |a 261060 |f TN27/E5

• 991 __022005002788

• 998 __ |a SJT

• 999 __ |t C |A zhouwei |a 20050124 10:37:37 |I zhouwei |i 20050124 10:38:16 |G zhouwei |g 20050124 10:38:3