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• 000 01709nam2 2200409 4500

• 000 1000001097

• 001 0000157609

• 003 CAL

• 005 20040610203029.0

• 008 010608s1991 paua b 101 0 eng d

• 010 __ |a 91055309

• 020 __ |a 0780302427 (library binding) |c CNY1396.21

• 020 __ |a 0818661569 (microfiche)

• 020 __ |a 0818691565 (hard)

• 040 __ |a RCE |c XAIT

• 050 _0 |a TK7874 |b .I593 1991

• 090 __ |a TN0-53/1:(91)E

• 093 __ |a TN0-53 |2 4

• 099 __ |a CAL 022001221181

• 111 2_ |a International Test Conference |n (22nd : |d 1991 : |c Nashville, Tenn.)

• 245 10 |a Proceedings : |b International Test Conference 1991, October 26-30, 1991, Opryland Hotel, Nashville, TN / |c sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section.

• 260 __ |a Altoona, Pa. : |b International Test Conference, |c c1991.

• 300 __ |a xiv, 1135 p. : |b ill. ; |c 28 cm.

• 500 __ |a "IEEE catalog number 91CH3032-0."

• 500 __ |a Cover title: Test: faster, better, sooner.

• 504 __ |a Includes bibliographies and index.

• 650 _0 |a Electronic digital computers |x Circuits |x Testing |x Congresses.

• 650 _0 |a Integrated circuits |x Testing |v Congresses.

• 710 2_ |a Institute of Electrical and Electronics Engineers. |b Philadelphia Section.

• 710 2_ |a IEEE Computer Society. |b Test Technology Technical Committee.

• 740 0_ |a International Test Conference 1991 proceedings.

• 740 0_ |a Test: faster, better, sooner.

• 905 __ |a XATU |d TN0-53/1:(91)E

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TN0-53/1:(91)

• 991 __022004001098

• 999 __ |t C |A zhouwei |a 20040610 20:27:41 |I zhouwei |i 20040610 20:30:29 |G zhouwei |g 20040610 20:31:0