机读格式显示(MARC)
- 000 01285nam2 2200361 4500
- 008 981216s1981 waua b 10100 eng
- 020 __ |a 0892523093 (pbk.) |c CNY4.10
- 050 00 |a TK7871.85 |b .O6
- 082 00 |a 621.3815/2/0287 |2 19
- 099 __ |a CAL 022000330872
- 245 00 |a Optical characterization techniques for semiconductor technology : |b April 1-2, 1981, San Jose, California / |c D.E. Aspnes, S. So, R.F. Potter, editors.
- 260 __ |a Bellingham, Wash. : |b Society of Photo-optical Instrumentation Engineers, |c 1981.
- 300 __ |a x, 262 p. : |b ill. ; |c 28 cm.
- 440 _0 |a Proceedings of the Society of Photo-optical Instrumentation Engineers ; |v v. 276
- 504 __ |a Includes bibliographical references and indexes.
- 650 _0 |a Semiconductors |x Testing |x Optical methods |x Congresses.
- 700 10 |a So, S. |q (Samuel S.)
- 905 __ |a XATU |d TN3-53/E2
- 950 __ |a 261060 |f TN3-53/E2
- 999 __ |t C |A zhouwei |a 20050124 16:20:33 |I zhouwei |i 20050124 16:21:28 |G zhouwei |g 20050124 16:21:5