机读格式显示(MARC)

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• 008 199405s1987 a b 101 0

• 010 __ |a 87061625

• 020 __ |a 0892528117 (pbk.) |c CNY8.70

• 040 __ |a DLC |c XAIT

• 050 00 |a TA1750 |b .M49 1987

• 082 00 |a 621.381/045 |2 20

• 090 __ |a O463/6E

• 093 __ |a O463 |2 4

• 099 __ |a CAL 022001118060 |a CAL 022000200065

• 245 00 |a Metrology of optoelectronic systems : |b 21-22 May 1987, Orlando, Florida / |c Edward M. Granger, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville ... et al. .

• 260 __ |a Bellingham, Wash., USA : |b SPIE, |c c1987.

• 300 __ |a vi, 123 p. : |b ill. ; |c 28 cm.

• 440 _0 |a Proceedings of SPIE--the International Society for Optical Engineering ; |v v. 776

• 504 __ |a Includes bibliographies and index.

• 650 _0 |a Optical measurements |x Congresses.

• 650 _0 |a Optoelectronic devices |x Measurement |x Congresses.

• 700 1_ |a Granger, Edward M.

• 710 1_ |a Society of Photo-optical Instrumentation Engineers. |a University of Alabama in Huntsville. |b Center for Applied Optics.

• 905 __ |a XATU |d O463/6E

• 920 __ |a 261060 |z 1

• 950 __ |a 61060 |f O463/6

• 991 __022004002086

• 999 __ |t C |A zhaining |a 20040918 10:35:00 |M zhaining |m 20040918 10:37:25 |G zhaining |g 20040918 10:38:0