机读格式显示(MARC)

• 000 01044nam2 2200289 4500

• 000 1000006621

• 001 0000162970

• 003 CAL

• 005 20050121094647.0

• 008 970425s1980 maua b 100 0 eng d

• 020 __ |a |c CNY5.20

• 040 __ |a SJT |c XAIT

• 090 __ |a TN4-53/E4

• 093 __ |a TN4-53 |2 4

• 099 __ |a CALB022000340351

• 111 2_ |a Microelectronics Measurement Technology Seminar |n (2nd : |d 1980 : |c San Jose, Calif.)

• 245 10 |a 2nd Microelectronics Measurement Technology Seminar : |b proceedings, San Jose Hyatt House, San Jose, CA., Mar. 11-12, 1980.

• 246 30 |a Microelectronics measurement technology seminar

• 246 30 |a Second microelectronics measurement technology seminar

• 260 __ |a Boston, MA. : |b Benwill, |c 1980.

• 300 __ |a 344 p. : |b ill. ; |c 28 cm.

• 504 __ |a Includes bibliographical references.

• 905 __ |a XATU |d TN4-53/E4

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TN4-53/E4

• 991 __022005002622

• 999 __ |t C |A zhaining |a 20050121 09:45:33 |M zhaining |m 20050121 09:46:47 |G zhaining |g 20050121 09:47:1