机读格式显示(MARC)

• 000 01069nam2 2200313 4500

• 000 1000006946

• 001 0000163283

• 003 CAL

• 005 20050124155731.0

• 008 961031s1981 nyua 100 0 eng d

• 020 __ |a |c CNY9.10

• 040 __ |a XAIT |c XAIT

• 041 0_ |a eng

• 090 __ |a TP306-53/E1:(81)

• 093 __ |a TP306-53 |2 4

• 099 __ |a CAL 022000337562

• 111 2_ |a International Test Conference |d (1981 : |c Philadelphia, Pa.)

• 245 10 |a Testing in the 1980's / |c 1981 International Test Conference, Philadelphia at the Franklin Plaza Hotel, Oct. 27-29, 1981.

• 260 __ |a New York : |b IEEE, |c 1981.

• 300 __ |a 568 p. : |b ill.

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Automatic checkout equipment |x Congresses.

• 650 _0 |a Integrated circuits |x Testing |x Congresses.

• 740 01 |a Test conference.

• 905 __ |a XATU |d TP306-53/E1:(81)

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TP306-53/E1:(81)

• 991 __022005002949

• 999 __ |t C |A shenxiaoyan |a 20050124 15:54:57 |M shenxiaoyan |m 20050124 15:57:31 |G shenxiaoyan |g 20050124 15:58:5