机读格式显示(MARC)

• 000 00786nam2 2200253 4500

• 000 1000001783

• 001 0000158273

• 005 20040708092917.0

• 008 040708s1987 enka b 001 0 eng d

• 020 __ |a 0124967353 |c CNY214.28

• 040 __ |a XAIT |c XAIT

• 090 __ |a TN407/1E

• 093 __ |a TN407 |2 4

• 245 00 |a Developments in integrated circuit testing |c D. M. Miller, editor.

• 260 __ |a London |b Academic Press Limited |c c1987.

• 300 __ |a x, 440 p. |b ill. |c 24 cm.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Digital integrated circuits |x Testing.

• 700 1_ |a Miller, D. M.

• 905 __ |a XATU |d TN407/1E

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TN407/1

• 991 __022004001793

• 999 __ |t A |A zhaining |a 20040708 09:29:17 |G zhaining |g 20040708 09:29:4