机读格式显示(MARC)

• 000 01103nam2 2200361 4500

• 000 1000007267

• 001 0000163595

• 003 CAL

• 005 20050125101547.0

• 008 981216s1973 nyua b 00110 eng

• 010 __ |a 73007581 //r842

• 020 __ |a 0471143111 |c CNY2.20

• 040 __ |c SJT

• 050 00 |a QC611 |b .C48

• 082 00 |a 537.6/22

• 090 __ |a TN385/E1

• 093 __ |a TN385 |2 3

• 099 __ |a CAL 022000331022

• 100 1_ |a Chaffin, R.J. |q (Roger James), |d 1941-

• 245 10 |a Microwave semiconductor devices: fundamentals and radiation effects |c [by] R. J. Chaffin.

• 260 __ |a New York, |b Wiley |c [1973]

• 300 __ |a x, 387 p. |b illus. |c 23 cm.

• 500 __ |a "A Wiley-Interscience publication."

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Semiconductors |x Effect of radiation on.

• 650 _0 |a Microwave circuits.

• 650 _0 |a Semiconductors.

• 905 __ |a XATU |d TN385/E1

• 920 __ |a 261060 |z 2

• 950 __ |a 261060 |f TN385/E1

• 991 __022005003236

• 998 __ |a SJT

• 999 __ |t C |A zhouwei |a 20050125 10:15:06 |I zhouwei |i 20050125 10:15:47 |G zhouwei |g 20050125 10:16:0