机读格式显示(MARC)

• 000 01199nam2 2200373 4500

• 000 1000001219

• 001 0000157729

• 003 CAL

• 005 20040617191009.0

• 008 901018s1990 nyua b 00110 eng

• 010 __ |a 90020940

• 020 __ |a 0824783956 (alk. paper) |c CNY1007.03

• 040 __ |a DLC |c XAIT

• 050 00 |a TA1522 |b .S57 1990

• 082 00 |a 621.36 |2 20

• 090 __ |a O432.2/1E

• 093 __ |a O432.2 |2 4

• 099 __ |a CAL 022000901357

• 100 1_ |a Sirohi, R. S.

• 245 10 |a Optical components, systems, and measurement techniques / |c Rajpal S. Sirohi, Mahendra P. Kothiyal.

• 260 __ |a New York : |b M. Dekker, |c c1991.

• 300 __ |a viii, 445 p. : |b ill. ; |c 24 cm.

• 490 1_ |a Optical engineering ; |v 28

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Lasers.

• 650 _0 |a Optical instruments.

• 650 _0 |a Optical measurements.

• 700 1_ |a Kothiyal, Mahendra P., |d 1949-

• 830 _0 |a Optical engineering (Marcel Dekker, Inc.) ; |v v. 28.

• 905 __ |a XATU |d O432.2/1E

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f O432.2/1

• 991 __022004001222

• 999 __ |t C |A zhaining |a 20040617 19:08:06 |M zhaining |m 20040617 19:10:09 |G zhaining |g 20040617 19:10:4