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- 000 01816nam2 2200409 4500
- 008 780928s1978 ne af b 101 0 eng d
- 020 __ |a 0444851305 |c CNY2.40
- 050 00 |a TA417.23 |b .D54 1978
- 099 __ |a CAL 021999668113
- 245 00 |a Diffraction and imaging techniques in material science, |n v.1 : |p electron microscopy / |c editors, S. Amelinckx, R. Gevers, J. Van Landuyt.
- 260 __ |a Amsterdam ; |a New York : |b North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, |c 1978.
- 300 __ |a 453 p. : |b ill. ; |c 23 cm.
- 500 __ |a Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.
- 504 __ |a Includes bibliographical references and index.
- 505 0_ |a v. 1. Electron microscopy.--v. 2. Imaging and diffraction techniques.
- 650 _0 |a Electrons |x Diffraction |x Congresses.
- 650 _0 |a Imaging systems |x Congresses.
- 650 _0 |a Electron microscopy |x Congresses.
- 700 1_ |a Landuyt, J. van.
- 700 1_ |a Amelinckx, S. |q (Severin)
- 711 2_ |a International Summer Course on Material Science |d (1969 : |c Antwerp, Belgium). |t Modern diffraction and imaging techniques in material science.
- 905 __ |a XATU |d TB302/E5
- 950 __ |a 261060 |f TB302/E5
- 999 __ |t C |A zhaining |a 20050118 15:23:01 |M zhaining |m 20050118 15:24:36 |G zhaining |g 20050118 15:25:0