机读格式显示(MARC)
- 000 01970nam2 2200421 4500
- 008 801001s1980 waua b 101 0 eng
- 020 __ |a 0892522380 |c CNY3.60
- 050 00 |a TA1522 |b .E97 1979
- 082 00 |a 620/.0044 |2 19
- 099 __ |a CAL 022000338536 |a CAL 021999623683
- 111 2_ |a European Congress on Optics Applied to Metrology |n (2nd : |d 1979 : |c Strasbourg, France)
- 245 10 |a 2nd European Congress on Optics Applied to Metrology (METROP) : |b presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France / |c editors, Michel Grosmann, Patrick Meyrueis ; organized by European Photonics Association in collaboration with the Society of Photo-optical Instrumentation Engineers.
- 246 00 |a Second European Congress on Optics Applied to Metrology (METROP)
- 260 __ |a Bellingham, Wash. : |b Society of Photo-optical Instrumentation Engineers, |c c1980.
- 300 __ |a x, 228 p. : |b ill. ; |c 28 cm.
- 440 _0 |a Proceedings of the Society of Photo-optical Instrumentation Engineers ; |v v. 210
- 504 __ |a Includes bibliographical references and indexes.
- 650 _0 |a Holographic interferometry |v Congresses.
- 650 _0 |a Speckle metrology |v Congresses.
- 650 _0 |a Optical measurements |v Congresses.
- 700 1_ |a Meyrueis, Patrick.
- 700 1_ |a Grosmann, Michel.
- 710 2_ |a Society of Photo-optical Instrumentation Engineers.
- 710 2_ |a European Photonics Association.
- 711 2_ |a Optics, Photonics, and Iconics Engineering Meeting |d (1979 : |c Strasbourg, France)
- 905 __ |a XATU |d TB9-53/E2:(79)
- 950 __ |a 261060 |f TB9-53/E2:(79)
- 999 __ |t C |A shenxiaoyan |a 20050117 16:03:59 |M shenxiaoyan |m 20050117 16:05:24 |G shenxiaoyan |g 20050117 16:05:5