机读格式显示(MARC)

• 000 01311nam2 2200385 4500

• 000 1000006528

• 001 0000162877

• 003 CAL

• 005 20050120151427.0

• 008 960618s1975 vaua 000 0 eng d

• 010 __ |a 78057209 //r852

• 020 __ |a |c CNY2.20

• 040 __ |a XAIT |c XAIT

• 050 00 |a TK7868.D5 |b L36

• 082 00 |a 621.3819/5835

• 090 __ |a TN609-62/E1:2

• 093 __ |a TN609-62 |2 4

• 099 __ |a CAL 021999623974

• 100 1_ |a Rony, Peter R.

• 245 14 |a The bugbook II : |b logic & memory experiments using TTL integrated circuits / |c by Peter R. Rony, David G. Larsen, with assistance by Robert A. Braden.

• 246 30 |a Bugbook two

• 246 30 |a Bugbook 2

• 260 __ |a Blacksburg, Virginia : |b E & L Instruments, Inc., |c 1975.

• 300 __ |a 1 v. (various pagings) : |b ill. ; |c 22 cm.

• 650 _0 |a Transistor-transistor logic circuits |x Experiments.

• 650 _0 |a Computer storage devices |x Experiments.

• 650 _0 |a Integrated circuits |x Experiments.

• 650 _0 |a Digital electronics |x Experiments.

• 700 1_ |a Braden, Robert A.

• 700 1_ |a Larsen, David G.

• 905 __ |a XATU |d TN609-62/E1:2

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TN609-62/E1:2

• 991 __022005002528

• 999 __ |t C |A zhaining |a 20050120 15:12:53 |M zhaining |m 20050120 15:14:27 |G zhaining |g 20050120 15:14:4