机读格式显示(MARC)
- 000 02215nam2 2200505 4500
- 008 780331c19709999nyuar1 1 a0eng
- 010 __ |a 82640313 |z 76180194
- 099 __ |a CAL 021999665384
- 111 2_ |a International Reliability Physics Symposium |n (19th : |d 1981 : |c Orlando)
- 222 _0 |a Reliability physics
- 245 10 |a Reliability physics 1981 : |b 19th annual proceedings, April 7-9, 1981 / |c Sponsored by the IEEE Electron Device Group and the IEEE Reliability Group.
- 260 __ |a New York, N.Y. : |b Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers, |c 1981.
- 300 __ |a 310 p. : |b ill. ; |c 28 cm.
- 362 1_ |a Began with vol. for 1970.
- 500 __ |a Cover title: IEEE 1980 international reliability physics.
- 504 __ |a Includes bibliographical references.
- 510 1_ |a Index to IEEE publications |x 0099-1368
- 550 __ |a Sponsored by: the IEEE Electron Devices Society and the IEEE Reliability Group, 1970- ; the IEEE Electron Devices Group and the IEEE Reliability Group, <1974-1978>; the IEEE Electron Devices Society and the IEEE Reliability Society, <1981->
- 650 _0 |a Integrated circuits |x Reliability |x Congresses.
- 650 _0 |a Integrated circuits |x Testing |x Congresses.
- 650 _0 |a Electronic apparatus and appliances |x Reliability |x Congresses.
- 650 _0 |a Electronic apparatus and appliances |x Testing |x Congresses.
- 710 2_ |a IEEE Reliability Society.
- 710 2_ |a Institute of Electrical and Electronics Engineers. |b Electron Devices Group.
- 710 2_ |a IEEE Electron Devices Society.
- 710 2_ |a IEEE Reliability Group.
- 780 00 |a Reliability Physics Symposium. |t Proceedings
- 905 __ |a XATU |d O4-53/E1;(81)
- 950 __ |a 261060 |f O4-53/E1;(81)
- 999 __ |t C |A zhaining |a 20041028 21:05:43 |M zhaining |m 20041028 21:08:09 |G zhaining |g 20041028 21:08:4