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• 000 01390nam2 2200313 4500

• 000 1000008343

• 001 0000164622

• 005 20050127150833.0

• 008 030325s1982 ohua b 101 0 eng d

• 020 __ |a 0876646925 |c CNY1.80

• 040 __ |a CUI |c XAIT

• 090 __ |a V24-53/E2:13-8

• 093 __ |a V24-53 |2 4

• 111 2_ |a International Symposium |n (28th : |d 1982 : |c Las Vegas, Nevada)

• 245 10 |a Atutorial program fundamentals of aerospace instrumentation |n v. 13 |a Fundamentals of test measurement |n v. 8: |b proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / sponsored by EDFAS, ISTFA

• 246 31 |a Fundamentals of test measurement

• 246 30 |a Proceedings of the 28th International Symposium

• 260 __ |a Materials Park, Ohio : |b ASM International, |c 1982

• 300 __ |a 103 p. : |b ill. ; |c 26 cm

• 504 __ |a Includes bibliographical references and index

• 650 _0 |a Electronic apparatus and appliances |x Testing |v Congresses

• 650 _0 |a Electronics |x Materials |x Testing |v Congresses

• 710 2_ |a Electronic Device Failure Analysis Society

• 710 2_ |a ASM International

• 905 __ |a XATU |d V24-53/E2:13-8

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f V24-53/E2:13-8

• 991 __022005004252

• 999 __ |t C |A shenxiaoyan |a 20050127 15:01:02 |M shenxiaoyan |m 20050127 15:08:33 |G shenxiaoyan |g 20050127 15:09:0