机读格式显示(MARC)
- 000 01842nam2 2200445 4500
- 008 980915s1981 enka b 101 0 eng d
- 020 __ |a 0904999882 (session 1)
- 020 __ |a 0904999890 (session 2)
- 020 __ |a 0904999904 (session 3)
- 020 __ |a 0904999912 (session 4)
- 020 __ |a 0904999920 (session 6)
- 020 __ |a 0904999939 (session 7) |c CNY1.10
- 040 __ |a BUPTL |c BUPTL |a XAIT
- 099 __ |a CAL 021999652325
- 245 00 |a Automatic testing 81 & test instrumentaion : |b Metropole Convention Centre, Brighton, England, 7-10 December 1981 / |c supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRONICS. |n v.7
- 246 3_ |a Automatic testing 81 and test instrumentaion
- 260 __ |a Buckingham, Bucks, UK : |b Network, |c c1981.
- 300 __ |a 61 p. : |b ill. ; |c 28 cm.
- 500 __ |a A joint IERE/NETWORK conference.
- 504 __ |a Includes bibliographical references and index.
- 505 10 |g session 1. |t To Atlas or not to Atlas? -- |g session 2. |t IEEE bus (GPIB) and its ATE applications -- |g session 3. |t General applications and ATE philosophy -- |g session 4. |t Quality assurance and production testing -- |g session 6. |t Software -- |g session 7. |t New techniques.
- 650 _0 |a Automatic checkout equipment |v Congresses.
- 710 2_ |a NETWORK (Organization)
- 710 2_ |a Institution of Electronic and Radio Engineers.
- 905 __ |a XATU |d TP216/E2:7
- 950 __ |a 261060 |f TP216/E2:7
- 999 __ |t C |A shenxiaoyan |a 20050127 10:34:21 |M shenxiaoyan |m 20050127 10:34:56 |G zhouwei |g 20050411 14:55:3