机读格式显示(MARC)

• 000 01591cam a2200529 a 4500

• 001 0000237957

• 003 CAL

• 005 20160323100800.0

• 008 140421r20142010cc a b 001 0 eng d

• 017 __ |a CN |b 08-2013-080

• 020 __ |a 9787560342818 (pbk.) |c CNY68.00

• 040 __ |a NPU |c NPU |d SCT

• 090 __ |a TN304.2/E1

• 093 __ |a TN304.2 |2 4

• 099 __ |a CAL 022014024778

• 245 00 |a Characterization in compound semiconductor processing = |b 化合物半导体加工中的表征 / |c [editors], Gary E. McGuire, Yale E. Strausser. |s 英文影印版

• 246 31 |a 化合物半导体加工中的表征

• 260 __ |a 哈尔滨 : |b Harbin Institute of Technology Press, |c 2014.

• 300 __ |a xvi, 199 p. : |b ill. ; |c 23 cm.

• 490 0_ |a Materials characterization series = |a 材料表征原版系列丛书

• 504 __ |a Includes bibliographical references and index.

• 534 __ |p Reprint. Originally published: |c New York : Momentum Press, 2010. |z 9781606500415.

• 650 _0 |a Compound semiconductors.

• 650 _0 |a Compound semiconductors |x Surfaces.

• 700 1_ |a Strausser, Yale.

• 700 1_ |a McGuire, G. E.

• 920 __ |a 244050 |z 1

• 920 __ |a 222010 |z 1

• 920 __ |a 261030 |z 2

• 920 __ |a 212010 |z 1

• 920 __ |a 211060 |z 2

• 920 __ |a 211010 |z 2

• 920 __ |a 231020 |z 1

• 920 __ |a 221020 |z 1

• 920 __ |a 234030 |z 2

• 920 __ |a 222040 |z 2

• 920 __ |a 235010 |z 2

• 920 __ |a 242010 |z 2

• 920 __ |a 253010 |z 2

• 920 __ |a 245010 |z 2

• 920 __ |a 221130 |z 2

• 920 __ |a 244020 |z 2

• 920 __ |a 221120 |z 1

• 920 __ |a 244010 |z 1

• 920 __ |a 242440 |z 2

• 920 __ |a 211130 |z 2

• 998 __ |a NPU