机读格式显示(MARC)

• 000 01053nam2 2200313 4500

• 000 1000006939

• 001 0000163276

• 003 CAL

• 005 20050124155302.0

• 008 961031s1980 nyua 100 0 eng d

• 020 __ |a |c CNY8.40

• 040 __ |a XAIT |c XAIT

• 041 0_ |a eng

• 090 __ |a TP306-53/E1:(80)

• 093 __ |a TP306-53 |2 4

• 099 __ |a CAL 022000337561

• 111 2_ |a International Test Conference |d (1980 : |c Philadelphia, Pa.)

• 245 10 |a Testing for the 80's / |c 1980 Test Conference, Franklin Plaza Hotel, Philadelphia, Nov. 11, 12, 13, 1980.

• 260 __ |a New York : |b IEEE, |c 1980.

• 300 __ |a 507 p. : |b ill.

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Automatic checkout equipment |x Congresses.

• 650 _0 |a Integrated circuits |x Testing |x Congresses.

• 740 01 |a Test conference.

• 905 __ |a XATU |d TP306-53/E1:(80)

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TP306-53/E1:(80)

• 991 __022005002942

• 999 __ |t C |A shenxiaoyan |a 20050124 15:48:35 |M shenxiaoyan |m 20050124 15:53:02 |G shenxiaoyan |g 20050124 15:53:4