机读格式显示(MARC)

• 000 01194nam2 2200325 4500

• 000 1000006886

• 001 0000163223

• 003 CAL

• 005 20050124151557.0

• 008 800101s1977 laua b 101 0 eng d

• 020 __ |c CNY6.60

• 040 __ |a ECN |c ECN |d SCT

• 090 __ |a TN27-53/E3

• 093 __ |a TN27-53 |2 3

• 099 __ |a CAL 022000878091

• 110 2_ |a Electron Microscopy Society of America. |b Meeting |n (35th : |d 1977 : |c Boston)

• 245 10 |a Proceedings of the 35th Annual Meeting, Electron Microscopy Society of America : |b Boston, Aug. 22-26, 1977 / |c edited by G.W. Bailey.

• 246 3_ |a Proceedings of the Thirty-Five Annual Meeting, Electron Microscopy Society of America

• 260 __ |a Baton Rouge : |b Claitor's Publication, |c 1977.

• 300 __ |a 699 p. : |b ill. ; |c 27 cm.

• 504 __ |a Includes bibliographical reference and index.

• 650 _0 |a Electron microscopy |v Congresses.

• 700 1_ |a Bailey, G. W.

• 710 2_ |a Electron Microscopy Society of America.

• 905 __ |a XATU |d TN27-53/E3

• 920 __ |a 261060 |z 2

• 950 __ |a 261060 |f TN27-53/E3

• 991 __022005002887

• 998 __ |a SCT

• 999 __ |t C |A zhouwei |a 20050124 15:15:00 |I zhouwei |i 20050124 15:15:57 |G zhouwei |g 20050124 15:16:1