机读格式显示(MARC)

• 000 01139nam2 2200289 4500

• 000 1000005648

• 001 0000162011

• 003 CAL

• 005 20050117113226.0

• 008 981216s1989 ne a 10110 eng

• 020 __ |a 044487450X |c CNY51.40

• 040 __ |c SJT |a XAIT

• 090 __ |a TG115.28-53/E1:2:12TH(89)

• 093 __ |a TG115.28-53 |2 3

• 099 __ |a CAL 022000317965

• 111 2_ |a World Conference on Non-Destructive Testing |n (12th : |d 1989 : |c Amsterdam)

• 245 10 |a Non-destructive testing : |b proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam, the Netherlands, Apr. 23-28, 1989 / |c edited by J. Boogaard and G.M. Van Dijk.

• 260 __ |a Amsterdam : |b Elsevier Science Pub., |c 1989.

• 300 __ |a 2 v. (1900 p.) : |b ill. ; |c 25 cm.

• 500 __ |a Includes bibliographical references and index.

• 650 00 |a Non-destructive testing |x Congresses.

• 700 12 |a Dijk, G. M. van.

• 700 12 |a Boogaard, J.

• 905 __ |a XATU |d TG115.28-53/E1:2:12TH(89)

• 950 __ |a 261060 |f TG115.28-53/E1:2:12th(89)

• 991 __022005001647

• 999 __ |t C |A zhouwei |a 20050117 11:31:54 |I zhouwei |i 20050117 11:32:26 |G zhouwei |g 20050117 11:32:4