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• 005 20050119155135.0

• 008 981216s1981 nyua b 10110 eng

• 010 __ |a 81083782

• 020 __ |a |c CNY1.90

• 040 __ |a XAIT |c SJT

• 050 0_ |a TK275 |b .E38 1981

• 082 0_ |a 621.37 |2 19

• 090 __ |a TN-53/E5:(81)

• 093 __ |a TN-53 |2 4

• 099 __ |a CAL 022000340708

• 111 2_ |a Electrical and Electronic Measurement and Test Instrument Conference and Exposition |d (1981 : |c Ottawa, Ont.)

• 245 10 |a Electrical and electronic measurement and test instrument conference and exposition, Ottawa, Canada / |c sponsors, IEEE Ottawa Section, Instrumentation and Measurement Society, Canadian and U.S. URSI-Commission A.

• 260 __ |a New York, N.Y. (345 E. 47 St., New York, N.Y. 10017) : |b IEEE, |c c1981.

• 300 __ |a i-10, 245 p. : |b ill. ; |c 22 cm.

• 500 __ |a "81 CH1710-3"--Cover.

• 500 __ |a At head of title: EEMTIC '81 digest.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Electronic measurements.

• 650 _0 |a Electric measurements |x Congresses.

• 710 20 |a IEEE Group on Instrumentaion & Measurement.

• 710 20 |a Canadian and U.S. URSI-Commission A.

• 710 20 |a Institute of Electrical and Electronics Engineers. |b Ottawa Section.

• 740 01 |a E.E.M.T.I.C. '81 digest.

• 740 01 |a EEMTIC '81 digest.

• 905 __ |a XATU |d TN-53/E5:(81)

• 920 __ |a 242010 |z 1

• 920 __ |a 212010 |z 1

• 920 __ |a 244050 |z 2

• 920 __ |a 211060 |z 1

• 920 __ |a 245010 |z 1

• 920 __ |a 243040 |z 1

• 920 __ |a 211010fg |z 2

• 920 __ |a 231030 |b TM93-53 |c E38E 1981 |z 1

• 920 __ |a 251030 |z 1

• 950 __ |a 261060 |f TN-53/E5:(81)

• 991 __022005002291

• 998 __ |a SJT

• 999 __ |t C |A shenxiaoyan |a 20050119 15:50:48 |M shenxiaoyan |m 20050119 15:51:35 |G shenxiaoyan |g 20050119 15:51:5