机读格式显示(MARC)

• 000 01811nam2 2200421 4500

• 000 1000005747

• 001 0000162109

• 003 CAL

• 005 20050117160329.0

• 008 920910s1992 paua b 101 0 eng d

• 010 __ |a 92073585

• 010 __ |a 92073585

• 020 __ |a 0780307607 (casebound) |c CNY26.50

• 020 __ |a 0818631678 (softbound)

• 020 __ |a 081863166X (microfiche)

• 040 __ |a DLC |c XAIT

• 050 00 |a TK7874 |b .I474 1992

• 082 00 |a 621.3815/028/7 |2 20

• 090 __ |a TB22-53/E1:(92)

• 093 __ |a TP22-53 |2 4

• 099 __ |a CAL 022000348752 |a CAL 022001221171

• 111 2_ |a International Test Conference |d (1992 : |c Baltimore, Md.)

• 245 10 |a Discover the new world of test and design : |b International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA / |c sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.

• 260 __ |a Altoona, PA : |b The Conference ; |a Piscataway, NJ : |b Can be ordered from IEEE Service Center, |c c1992.

• 300 __ |a xii, 1012 p. : |b ill. ; |c 28 cm.

• 500 __ |a "IEEE catalog number 92-CH3191-4"--P. ii.

• 500 __ |a "IEEE Computer Society Press order number 3167"--P. ii.

• 500 __ |a Cover title.

• 504 __ |a Includes bibliographical refrences and index.

• 650 00 |a Automatic checkout equipment |x Congresses.

• 650 00 |a Integrated circuits |x Testing |x Congresses.

• 710 2_ |a Institute of Electrical and Electronics Engineers. |b Philadelphia Section.

• 710 2_ |a IEEE Computer Society. |b Test Technology Technical Committee.

• 905 __ |a XATU |d TB22-53/E1:(92)

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TB22-53/E1:(92)

• 991 __022005001746

• 999 __ |t C |A zhaining |a 20050117 16:01:26 |M zhaining |m 20050117 16:03:29 |G zhaining |g 20050117 16:03:5