机读格式显示(MARC)

• 000 01074nam2 2200349 4500

• 000 1000005568

• 001 0000161934

• 003 CAL

• 005 20050117095810.0

• 008 981214s1984 enka b 00110 eng

• 020 __ |a 0412233908 |c CNY2.00

• 020 __ |a 0412234009 (pbk.)

• 037 __ |a 9009521 |c 234.85

• 040 __ |a XAIT |c XAIT

• 050 00 |a TA417.23 |b .L67 1984

• 082 00 |a 620.1/127 |2 19

• 090 __ |a TB302.1/E1

• 093 __ |a TB302.1 |2 4

• 099 __ |a CAL 022000309056

• 100 1_ |a Loretto, M. H.

• 245 10 |a Electron beam analysis of materials / |c M.H. Loretto.

• 260 __ |a London ; |a New York : |b Chapman and Hall, |c 1984.

• 300 __ |a vi, 210 p. : |b ill. ; |c 25 cm.

• 504 __ |a Includes bibliographies and index.

• 650 _0 |a Electron beams |x Industrial applications.

• 650 _0 |a Electron microscopy.

• 650 _0 |a Materials |x Analysis.

• 905 __ |a XATU |d TB302.1/E1

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TB302.1/E1

• 991 __022005001567

• 999 __ |t C |A shenxiaoyan |a 20050117 09:56:47 |M shenxiaoyan |m 20050117 09:58:10 |G shenxiaoyan |g 20050117 09:58:4