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• 000 1000008393

• 001 0000164670

• 005 20050228162358.0

• 008 050228s1984 caua b 101 0 eng d

• 020 __ |a |c CNY不详

• 040 __ |a XAIT |c XAIT

• 090 __ |a TG115.21/E2:(84)

• 093 __ |a TG115.21 |2 4

• 245 00 |a Analytical eletron microscopy 1984 |b proceedings of a Workshop held at Bethlehem, Pennsylvania, 16-20 July 1984 |c editors, D. B. Williams, D. C. Joy, sponsored by microbeam analysis society co-sponsored by department of metallurgy and meterials engineering meterials research center, lehigh university North East Tier Ben Franklin Technology Center, The metalssociety(Great Britain)

• 260 __ |a San Francisco, CA |b The Francisco Press, Inc. |c 1984.

• 300 __ |a vi, 378 p. |b ill. |c 30 cm

• 504 __ |a Includes bibliographical references and index.

• 650 _2 |a Analytical eletron microscopy.

• 700 1_ |a Joy, D. C.

• 700 1_ |a Williams, D. B.

• 905 __ |a XATU |d TG115.21/E2:(84)

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TG115.21/E2:(84)

• 991 __022005004303

• 999 __ |t A |A shenxiaoyan |a 20050228 16:23:58 |G shenxiaoyan |g 20050228 16:24:5