机读格式显示(MARC)

• 000 01178nam2 2200325 4500

• 000 1000008861

• 001 0000165126

• 003 CAL

• 005 20060824105617.0

• 008 981212s1980 waua b 00100 eng

• 020 __ |a 0892522720 (pbk.) |c CNY3.80

• 040 __ |a SJT |c XAIT

• 050 0_ |a QC427.8.S64 |b A66

• 082 0_ |a 535/.4 |2 19

• 090 __ |a O436-53/E1:(80)

• 093 __ |a O436-53 |2 4

• 099 __ |a CAL 022000342995

• 245 00 |a Applications of speckle phenomena : |b July 29-30, 1980, San Diego, California / |c William H. Carter, editor.

• 260 __ |a Bellingham, Wash. : |b Society of Photo-optical Instrumentation Engineers, |c c1980.

• 300 __ |a vi, 166 p. : |b ill. ; |c 28 cm.

• 440 _0 |a Proceedings of the Society of Photo-optical Instrumentation Engineers ; |v v. 243

• 504 __ |a Includes bibliographical references and indexes.

• 650 _0 |a Speckle metrology |x Congresses.

• 650 _0 |a Speckle |x Congresses.

• 700 1_ |a Carter, William H.

• 905 __ |a XATU |d O436-53/E1:(80)

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f O436-53/E1:(80)

• 991 __022006000199

• 999 __ |t C |A shenxiaoyan |a 20060824 10:55:21 |M shenxiaoyan |m 20060824 10:56:17 |G shenxiaoyan |g 20060824 10:56:3