机读格式显示(MARC)

• 000 00929nam2 2200277 4500

• 000 1000008394

• 001 0000164671

• 005 20050228164653.0

• 008 050228s1976 alua 000 0 eng d

• 020 __ |a |c CNY1.50

• 040 __ |a XAIT |c XAIT

• 090 __ |a TG115.28-53/E3:(76)

• 093 __ |a TG115.28-53 |2 4

• 100 1_ |a Kinariwala, V. R.

• 245 10 |a Flaw detection in thin composite material structures with holographic techniques |c by V. R. Kinariwala, W. F. Ranson, W. F. Swinson.

• 260 __ |a Auburn, Alabama |b Engineering Experiment Station |c 1976.

• 300 __ |a 82 p. |b ill. |c 28 cm

• 500 __ |a Technical report.

• 650 _0 |a Flaw detection |x Technical report.

• 700 1_ |a Swinson, W. F.

• 700 1_ |a Ranson, W. F.

• 905 __ |a XATU |d TG115.28-53/E3:(76)

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TG115.28-53/E3:(76)

• 991 __022005004304

• 999 __ |t A |A shenxiaoyan |a 20050228 16:46:53 |G shenxiaoyan |g 20050228 16:47:2