机读格式显示(MARC)

• 000 01374nam2 2200385 4500

• 000 1000007008

• 001 0000163344

• 005 20050124163951.0

• 008 970717s1987 nyuqr1p 0 a0eng d

• 020 __ |a |c CNY22.70

• 022 0_ |a 1094-6969

• 040 __ |a NSDP |c XAIT

• 042 __ |a lc |a nsdp

• 050 00 |a TK7881 |b .I285

• 082 00 |a 621.381 |2 21

• 090 __ |a TM93-53/E15:(87)

• 093 __ |a TM93-53 |2 4

• 245 00 |a IEEE instrumentation & measurement technology conference.

• 246 13 |a Instrumentation & measurement

• 246 30 |a IEEE instrumentation and measurement magazine

• 260 __ |a New York, NY : |b Institute of Electrical and Electronics Engineers, |c c1987.

• 300 __ |a xix, 328 p. : |b ill. ; |c 28 cm.

• 500 __ |a Title from cover.

• 550 __ |a Organ of the IEEE Instrumentation and Measurement Society.

• 610 20 |a IEEE Instrumentation and Measurement Society |x Periodicals.

• 650 _0 |a Electronic instruments |x Periodicals.

• 650 _0 |a Mensuration |x Periodicals.

• 650 _0 |a Testing |x Periodicals.

• 650 _0 |a Industrial electronics |x Periodicals.

• 710 2_ |a IEEE Instrumentation and Measurement Society.

• 905 __ |a XATU |d TM93-53/E15:(87)

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f TM93-53/E15:(87)

• 991 __022005003007

• 999 __ |t C |A shenxiaoyan |a 20050124 16:36:35 |M shenxiaoyan |m 20050124 16:39:51 |G shenxiaoyan |g 20050124 16:40:1